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dc.contributor.authorSafaa, I. Mohammed
dc.contributor.authorNaser, M. Ahmed
dc.contributor.authorYarub, Al-Douri, Assoc. Prof. Dr.
dc.contributor.authorUda, Hashim, Prof. Dr.
dc.date.accessioned2014-03-13T07:14:18Z
dc.date.available2014-03-13T07:14:18Z
dc.date.issued2014-01
dc.identifier.citationAdvanced Materials Research, vol.879, 2014, pages 175-179en_US
dc.identifier.issn1662-8985
dc.identifier.urihttp://dspace.unimap.edu.my:80/dspace/handle/123456789/32663
dc.descriptionLink to publisher's homepage at http://www.ttp.net/en_US
dc.description.abstractLead iodide (PbI₂) thin films were successfully prepared by thermal evaporation method on a glass substrate at room temperature. The structural analysis of these films was done by XRD. The results revealed that the crystallite size increases when increasing the film thickness and annealing temperature. In addition, the preferred growth orientation was 001 for all the samples.en_US
dc.language.isoenen_US
dc.publisherTrans Tech Publicationsen_US
dc.subjectPbI₂ thin filmen_US
dc.subjectStructural propertiesen_US
dc.subjectThermal evaporationen_US
dc.titleStructural properties of PbI₂ thin filmen_US
dc.typeArticleen_US
dc.identifier.urlhttp://www.scientific.net/AMR.879.175
dc.contributor.urlSafaa.idan@yahoo.comen_US
dc.contributor.urlnas_tiji@yahoo.comen_US
dc.contributor.urlyaldouri@yahoo.comen_US
dc.contributor.urluda@unimap.edu.myen_US


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