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dc.contributor.authorMohd Khairuddin, Md Arshad
dc.contributor.authorUda, Hashim
dc.contributor.authorMing, Choo Chew
dc.date.accessioned2009-08-10T02:33:00Z
dc.date.available2009-08-10T02:33:00Z
dc.date.issued2006
dc.identifier.citationp.514-517en_US
dc.identifier.isbn978-1-4244-0730-9
dc.identifier.issn1089-8190
dc.identifier.urihttp://ieeexplore.ieee.org/xpls/abs_all.jsp?=&arnumber=4456504
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/6761
dc.descriptionLink to publisher's homepage at http://ieeexplore.ieee.orgen_US
dc.description.abstractThe induced power supply noise (sinusoidal waveform) that injected to Vdd pin will cause unwanted spike at the positive amplitude and negative amplitude to the DC input voltage. At certain limit this spike will cause the mouse sensor unable to function properly and it may interrupt the communication line for read and write operation between mouse sensor and microcontroller. In this paper we report the characterization results of power supply noise for optical mouse sensor. A laboratory test setups that consist of digital oscilloscope, function generator and VEE-Pro software are used to evaluate three different samples of optical mouse sensor known as SS skew, FF skew and Nominal skew. Results suggest that the all mouse sensor with different skew was able to withstand beyond of 100 mVpp power supply noise without any interruption.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineering (IEEE)en_US
dc.relation.ispartofseriesProceedings of the IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposiumen_US
dc.subjectOptical mouse sensoren_US
dc.subjectPower supply noiseen_US
dc.subjectElectronic apparatus and appliances -- Power supplyen_US
dc.subjectMicrocontrolleren_US
dc.subjectDetectorsen_US
dc.subjectMouse sensoren_US
dc.titleThe characterization of power supply noise for optical mouse sensoren_US
dc.typeArticleen_US


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