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dc.contributor.authorAmiza, Rasmi
dc.contributor.authorUda, Hashim
dc.contributor.authorAwang Mat, Abd F
dc.date.accessioned2009-08-13T08:36:18Z
dc.date.available2009-08-13T08:36:18Z
dc.date.issued2006
dc.identifier.citationp.367-372en_US
dc.identifier.isbn0-7803-9730-4
dc.identifier.urihttp://ieeexplore.ieee.org/xpls/abs_all.jsp?=&arnumber=4266633
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/6888
dc.descriptionLink to publisher's homepage at http://ieeexplore.ieee.orgen_US
dc.description.abstractOne of the great problems in current large-scale integrated circuits (LSIs) is increasing power dissipation in a small silicon chip. Single-electron transistor (SET) which operate by means of one-by-one electron transfer, small size and consume very low power are suitable for achieving higher levels of integration. In this paper, SET is designed with lOOnm gate length and 10nm gate width is successfully simulated by Synopsys TCAD. The power of SET device that obtained from simulation is 3.771 x 10-9 Watt for fixed current and 3.3565 x 10-9 Watt if fixed the gate voltage, VG, and the capacitance of this device is 0.4297 aF. These results were achieved at room temperature operation.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineering (IEEE)en_US
dc.relation.ispartofseriesProceedings of the IEEE International Conference on Semiconductor Electronics (ICSE 06)en_US
dc.subjectCircuit simulationen_US
dc.subjectIntegrated circuits -- Design and constructionen_US
dc.subjectSingle electron transistorsen_US
dc.subjectTransistorsen_US
dc.subjectIntegrated circuit designen_US
dc.subjectSynopsys TCADen_US
dc.titleDesign of 100nm single-electron transistor (SET) by 2D TCAD simulationen_US
dc.typeArticleen_US


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