Total Visits

Views
Electrical characterization of 0.13 µm NMOS transistor with Retrograde Well and Halo Implant Structure Respectively119

Total Visits Per Month

December 2024January 2025February 2025March 2025April 2025May 2025June 2025
Electrical characterization of 0.13 µm NMOS transistor with Retrograde Well and Halo Implant Structure Respectively7241330

File Visits

Views
Conclusion.pdf4
Introduction.pdf4
Literature review.pdf4
Methodology.pdf3
Results and discussion.pdf3
References and appendix.pdf2
Abstract, Acknowledgment.pdf1

Top country views

Views
United States55
Malaysia12
Vietnam9
China7
Finland6
Argentina4
Australia4
Belgium4
Germany4
Singapore3

Top cities views

Views
Hanoi9
Kuala Lumpur9
Boardman6
Des Moines5
San Mateo5
Andover3
Batu Tiga2
Los Angeles2
Perth2
Singapore2