Browsing School of Microelectronic Engineering (FYP) by Author "Mohamad Sharizal Md Ilias"
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Study of Deposition Time Influence the Conical Structure during Electron Beam Induced Deposition (EBID)
Mohamad Sharizal Md Ilias (Universiti Malaysia PerlisSchool of Microelectronic Engineering, 2008-04)Atomic force microscopy (AFM) is now a well-established technique for the surface characterization and imaging of a variety of materials. In AFM the accuracy of data is often limited by the tip geometry and the effect on ...