Browsing School of Microelectronic Engineering (FYP) by Subject "Aluminum bond pad activation"
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Characterization of Electroless Under Bump Metallurgy for Alsi Bond Pad Composition
(Universiti Malaysia PerlisSchool of Microelectronic Engineering, 2007-03)The characterization of electroless under bump metallurgy for AlSi bond pad composition in term of surface morphology and surface roughness was investigated. By using the sample given, the gold layer need to be deposited ...