Browsing School of Microelectronic Engineering (FYP) by Subject "Atomic Force Microscope"
Now showing items 1-2 of 2
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Reactive Ion Etching (RIE) Etched Wet-Silica-On-Silicon Analysis for Fluid Wettability
(Universiti Malaysia PerlisSchool of Microelectronic Engineering, 2007-03)RIE etched wet silica-on-silicon analysis is more to surface roughness analysis which analysis on silica substrate after plasma etching especially on de-ionized water droplets testing for fluid wettability scope. The thick ... -
Study of Deposition Time Influence the Conical Structure during Electron Beam Induced Deposition (EBID)
(Universiti Malaysia PerlisSchool of Microelectronic Engineering, 2008-04)Atomic force microscopy (AFM) is now a well-established technique for the surface characterization and imaging of a variety of materials. In AFM the accuracy of data is often limited by the tip geometry and the effect on ...