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Electrical characterization of 0.13 µm NMOS transistor with Retrograde Well and Halo Implant Structure Respectively97

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Electrical characterization of 0.13 µm NMOS transistor with Retrograde Well and Halo Implant Structure Respectively331141410

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Introduction.pdf3
Conclusion.pdf2
Literature review.pdf2
References and appendix.pdf2
Abstract, Acknowledgment.pdf1
Methodology.pdf1
Results and discussion.pdf1

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